iMetal-500B/BD Inverted Metallographic Microscope
Product Features & Applications
Product Feature:
- The iMetal-500 adopts an infinite optical system, matched with plan semi-apochromatic objectives and large-field high-eyepoint eyepieces, restoring the true details of metallographic structures to meet high-precision testing requirements.
- The optimal light intensity is automatically matched when switching objective magnifications, eliminating the need for repeated manual adjustment, reducing operational steps, avoiding human errors and greatly improving testing fluency.
- The 4400K-4600K warm white LED light source has a color rendering index (CRI) of ≥95, accurately restoring the true color of samples, avoiding misjudgment caused by color deviation, and is suitable for metallographic grading and image analysis.
- A rich variety of optional accessories are available, including bright-dark field illumination, polarizing observation and DIC observation.
- The coarse and fine coaxial focusing system (1μm fine adjustment scale value) and 50×50mm large-travel stage are combined with a five-hole encoded nosepiece, realizing precise positioning, smooth operation and stable precision during long-term use.
Product Applications:
- Used for grading the grain size and inclusions of steel, non-ferrous metals and other materials, and evaluating the effect of heat treatment processes and material properties.
- Detecting defects such as cracks, blowholes and porosity in castings and weldments, tracing the causes of failure to ensure the quality and reliability of products.
- Accurately observing microstructural changes after processes such as quenching and annealing, optimizing process parameters to ensure the process stability of mass production.
- Clearly presenting the microstructures of weld fusion zones and heat-affected zones, detecting defects such as incomplete penetration and slag inclusions to meet the acceptance criteria of welding processes.
- Observing the porosity and sintered structure of powder metallurgy parts, as well as the thickness and bonding interface of coatings and platings to control coating quality.
- Suitable for teaching experiments in materials science for metallographic structure observation and material performance analysis.
Technical Specifications
| Specification | iMetal-500 B | iMetal-500 B/BD |
| Optical Path | Bright Field | Bright and Dark Field |
| Optical System | Infinite optical system, intelligent light intensity management LED system. | Infinite optical system, intelligent light intensity management LED system. |
| Observation Tube | Hinged trinocular observation tube (compatible with imaging system), 30° inclined, interpupillary distance 48-86mm, adjustable eyepoint, beam splitter ratio 100:0, 0:100. | Hinged trinocular observation tube (compatible with imaging system), 30° inclined, interpupillary distance 48-86mm, adjustable eyepoint, beam splitter ratio 100:0, 0:100. |
| Eyepiece | Ultra-wide field eyepiece 10X (field number Ф22mm), high eyepoint, diopter adjustable. | Ultra-wide field eyepiece 10X (field number Ф22mm), high eyepoint, diopter adjustable. |
| Objective Lens | MPL5X,NA=0.15,WD=14.8mm | MPL5X,NA=0.15,WD=16.5mm |
| MPL10X,NA=0.3,WD=8.5mm | MPL10X,NA=0.3,WD=11.7mm | |
| MPL20X,NA=0.45,WD=3.5mm | MPL20X,NA=0.45,WD=13mm | |
| MPL50X,NA=0.75,WD=3mm | MPL50X,NA=0.8,WD=3.5mm | |
| Polarizing Observation | Reflective polarizer (optional) 360° rotatable analyzer (optional) | Reflective polarizer 360° rotatable analyzer |
| Objective Nosepiece | Five-hole encoded nosepiece (RMS) | Five-hole encoded nosepiece (M26) |
| Observation | High-resolution DIC, adjustable focal length (optional) High-resolution DIC, fixed focal length (optional) | High-resolution DIC, adjustable focal length (optional) High-resolution DIC, fixed focal length (optional) |
| Reflective Illumination System | LED illumination, color temperature 4400K-4600K, CRI≥95. | LED illumination, color temperature 4400K-4600K, CRI≥95. |
| Reflective Observation | Bright field Kohler illumination system, 50,000-hour LED light source. | Bright field Kohler illumination system, 50,000-hour LED light source. |
| Focusing System | Coarse and fine coaxial, adjustable tightness, 1μm fine adjustment scale value. | Coarse and fine coaxial, adjustable tightness, 1μm fine adjustment scale value. |
| Stage | 260*200mm double-layer mechanical stage, 50*50mm travel range. | 260*200mm double-layer mechanical stage, 50*50mm travel range. |
| Intelligent Management | The control circuit automatically adjusts the light intensity to the optimal level when changing the objective magnification. | The control circuit automatically adjusts the light intensity to the optimal level when changing the objective magnification. |
| Camera Interface | Standard C-mount 0.5X, parfocal adjustable, suitable for CCD within 2/3 inch. | Standard C-mount 0.5X, parfocal adjustable, suitable for CCD within 2/3 inch. |
Standard Configuration
| Name | Qty | Photo | |
| Mainframe | 1pc | ![]() |
|
| Eyepiece 10X/22mm | 2pcs | ![]() |
|
| Objective Lens | MPL5X,NA=0.15,WD=14.8mm | 1pc | ![]() |
| MPL10X,NA=0.3,WD=8.5mm | 1pc | ||
| MPL20X,NA=0.45,WD=3.5mm | 1pc | ||
| MPL50X,NA=0.75,WD=3mm | 1pc | ||
| Nosepiece | 1pc | ![]() |
|
| Stage | 1pc | ![]() |
|
| 0.5x C-Type Camera Adaptor | 1pc | ![]() |
|
| Industrial Camera | 1pc | ![]() |
|
| High-precision Micrometer (0.01mm scale value) | 1pc | ![]() |
|
| Dust Cover | 1pc | ![]() |
|
| Power Cord | 1pc | ![]() |
|
Optional Configuration
| Eyepiece | 10X/23mm, diopter adjustable |
| Objective Lens | MPLFL2.5X NA0.08 WD9.8 |
| MPLFL100X NA0.9 WD1 | |
| LMPLFL100BD NA0.9 WD1.1 | |
| LMPLAP050XBD NA0.6 WD8.8 | |
| LMPLAP0100XBD NA0.85 WD3.3 | |
| Polarizing Observation | Reflection polarizer |
| 360°rotatable analyzer | |
| Differential Interference Contrast (DIC) | High-resolution DIC, adjustable focal length High-resolution DIC, fixed focal length |
| Camera | 1pc |
| Camera Cable | 1pc |
| Camera Adaptor | Standard C-mount 1X, parfocal adjustable, suitable for CCD within 4/3 inch |
| Metallographic Microscopic | ![]() |
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Last updated: 2026-04-08
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