（BF）-The First Choice for Routine Metallographic Observation.
- Observing the overall macroscopic morphology of samples and routine metallographic structures (e.g., grain size, grain boundaries, phase distribution, surface roughness, coating thickness).
- Routine metallographic grading of metallic materials (e.g., grain size grading, inclusion grading, observation of heat-treated microstructures).
- Rapid screening of batch samples and routine quality inspection.
（DF）-Specialized Observation of Micro Defects / Transparent Inclusions
- Observing micro defects in metallic materials (blowholes, inclusions, cracks, porosity, pinholes).
- Identifying transparent/translucent inclusions (e.g., oxides, sulfides, silicates) and distinguishing inclusion types.
- Observing surface scratches, micro pits, coating pinholes and other details that are difficult to distinguish under bright field .
（PL）-Specialized for Anisotropic Materials / Phase Differentiation
- Observing anisotropic materials (e.g., non-metallic inclusions, liquid crystals, minerals, crystal orientations, and anisotropic metals such as magnesium/titanium alloys).
- Distinguishing different metallographic phases (e.g., ferrite/cementite in steel, secondary phases in aluminum alloys).
- Observing stress birefringence, crystal texture, and the morphology of anisotropic microstructures.
（DIC）-Observation of Tiny Height Differences / 3D Topography.
- Observing tiny height differences on the sample surface (e.g., grain boundaries, phase boundaries, surface scratches, micro steps, film thickness variations).
- Observing soft materials, etch-sensitive samples, semiconductor wafers, biological samples and other samples unsuitable for etching.
- Observing fine microstructures and surface undulations with insufficient contrast under bright field.
