iStereo-6745 Stereo Microscope

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https://mikrosize.uk/product/istereo-6745-stereo-microscope/

Product Features：

Premium optical components coated with special coatings deliver high-quality optical images.
It produces erect images with flat focal planes and excellent contrast across a wide field of view, featuring notably brighter, sharper imagery at peripheral fields.
Equipped with a 0.67X–5X continuous zoom objective lens (6.7:1 zoom ratio). Paired with WF10X eyepieces, the standard magnification ranges from 6.7X to 45X. Optional auxiliary objectives extend the magnification range to 2.01X–270X.
The standard effective working distance is 105 mm. Fitted with optional auxiliary objectives, the working distance can be extended to 26–287 mm (1.02–30 inch), providing ample operating space.
The observation head tilts at 45° with binocular diopter adjustment, allowing users with varying eyesight to capture crisp, satisfying viewing images.
Ergonomic structural design with optimal eye-point height avoids fatigue during long-hour observation.
Zoom handwheels are horizontally (axially) mounted on both sides for convenient, comfortable operation and outstanding zoom repeatability.

Product Applications：

Ideal for microstructural observation and defect inspection of electronic components, precision mechanical parts, PCBs, new materials and other workpieces.
Meets requirements for on-site real-time quality control and high-precision laboratory analysis, covering incoming material inspection, process monitoring, finished product acceptance and other workflow stages.
Supports precise dimensional measurement and data archiving, suited for multiple scenarios including research institutes, factory QC departments and university laboratories.
Allows comparative analysis between real-time captured images and stored snapshots to streamline consistency verification and anomaly troubleshooting in mass production.
Compatible with specimens made of metals, plastics, electronic components and other materials, and satisfies inspection demands for both planar and three-dimensional structures.