iSurfa-100 Benchtop Roughness Tester
Product Features & Applications
Product Features:
- Uses imported chip sensor with resolution up to 0.01μm.
- Roughness measurement range ±1500μm, meeting high-precision industrial inspection needs.
- Supports multi-dimensional analysis of profile and roughness, covering multiple parameters (e.g., Ra, Rz, etc.).
- Import/export CAD files for profile comparison.
- Automatic programming enables rapid detection and OK/NG judgment, improving efficiency.
- Three-axis Hall joystick control for flexible and convenient operation.
- Electric column system with linear guide ensures motion stability.
- Automatic contact protection reduces stylus damage.
- Climbing angle: ascent 77°, descent 87°, suitable for complex workpiece surface inspection.
- Equipped with large-angle adjustable worktable (±30° tilt) and adjustable flat-nose pliers (0~45°).
- Supports detection of minimum internal bore of 5mm.
- Uses Class 00 (accuracy error 3μm) granite base for strong vibration resistance and long-term stability.
- Software supports one-click generation of PDF/Word/Excel reports with diverse output formats.
- Modular design (e.g., carbon fiber probe arm, hard alloy stylus) for easy replacement and low maintenance cost.
Product Applications:
- Automotive Manufacturing.
- Inspects surface roughness and profile accuracy of precision components (gears, bearings) to ensure lubrication, sealing, and fatigue life of friction pairs, preventing functional failure due to surface defects.
- Aerospace.
- Verifies machining quality of high-precision curved surfaces, analyzes surface waviness, and ensures aerodynamic performance and structural strength of components in extreme environments.
- Precision Electronics & Semiconductor Manufacturing.
- Measures nano-level roughness (Rq, Rsk) and micro-profiles to ensure signal transmission stability and prevent short circuits or signal attenuation caused by surface defects..
Technical Specifications
| Measurement Range | X-direction drive | 120mm |
| roughness range | ±1500μm | |
| resolution | 0.01μm | |
| Z-axis height (column) | 400mm | |
| Profile Technical Parameters | Linearity accuracy | ±(0.7+|0.12H|)μm |
| Straightness | 0.5μm/100mm | |
| Roughness Technical Parameters | Linearity accuracy | ≤±5% |
| Residual noise | ≤0.005μm | |
| Repeatability stability | 3% of reading value | |
| Cutoff wavelengths | 0.025、0.08、0.25、0.8、2.5、8mm | |
| Evaluation length | λcX1、2、3、4、5 | |
| Resolution | 0.01μm | |
| Climbing Angle | Ascent: 77° Descent: 88° | |
| Roughness Evaluation Parameters | Ra、Rz、(Rmax、Ry)、Rt、Rp、Rpm、Rz(jis)、Rv、R3z、Rs m、Rsk、Rk、Rc、Rpk、Rvk、Mr1、Mr2 | |
| Measurement Speed | 0.05-20mm/s | |
| Z-axis Speed | 0.05-20mm/s | |
Standard Configuration
| Item | Quantity |
| Roughness Profiler Main Unit | 1 |
| Large-Angle Adjustable Worktable | 1 |
| Flat-Nose Pliers | 1 |
| Calibration Standards | 1 |
| Stylus | 1 |
| Probe Arm | 1 |
| Computer | 1 |
| Printer | 1 |
| Software USB Drive | 1 |
| Certificate of Conformity | 1 |
| Warranty Card | 1 |
| Software Operation Manual | 1 |
Optional Configuration
| Different Size Styli |
| Fixtures |
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Last updated: 2026-02-14
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